Impact of Hierarchical Dopant‐Induced Microstructure on Thermoelectric Properties of p‐Type Si‐Ge Alloys Revealed by Comprehensive Multi‐Scale Characterization

What the provider reports

Authors

Kyuseon Jang, Won‐Seok Ko, Ji‐Hee Son, Jeongin Jang, Bongseo Kim, Miquel Vega‐Paredes, Hanhwi Jang, Maryam Allahyari, Se‐Ho Kim, KenHee Ryou, Donghyeon Chae, Hail Park, Yeon Sik Jung, Min‐Wook Oh, Chanwon Jung, Christina Scheu, Pyuck‐Pa Choi

Published

25 April 2024

Venue

Advanced Functional Materials

DOI

10.1002/adfm.202403785

OpenAlex id

W4395465481

Primary topic, as reported

Advanced Thermoelectric Materials and Devices (T10440)

Access, as reported

Open access: hybrid; licence cc-by. Reported access is not verified reuse permission.

Retraction, as reported

Not reported retracted

Landing page

https://doi.org/10.1002/adfm.202403785

PDF link, as reported

None served

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